1 year +
Eindhoven area, the Netherlands
As a Measurement Application Engineer on overlay and focus you will specify, design, develop, realize, and test subsystems. This will be within the limits of system specifications, costs and project planning. You will have an active role in reviewing technical contributions from the team.
You define requirements of new functional modules in the Yieldstar, based on new features which are requested by the customer. You have to realize detailed designs for proposed solutions and prepare for testing and roll out of this functionality after implementation. In the position you need to travel to customers and operate on-site for a period of one or more weeks at the time on a regular basis.
Wafer metrology within the framework of lithography (overlay and/or scanner focus measurement)
Data analysis and performance analysis. This with an overview of the entire value chain towards the customer. This includes the analysis of issues which are related to processing artefacts interfering with the accuracy of the data
Realize Performance on Improvements (technically and usability) of wafer measurements using scatterometry, this includes hardware and software improvements of the scatterometry based metrology system.
Master or PhD in Physics or Engineering,
Established experience in customer interaction and application support. Preferably in the area of metrology or tuning of semiconductor processes
3-5 years’ experience in a relevant work environment within the industry
Result oriented attitude; we are looking for an person that can work with set deadlines
Pragmatic approach; you should be capable of thinking in pragmatic solutions
Pro-active; it is expected that you take initiative to (help) drive progress
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